NASDAQ, NANO - Nanometrics Inc
We are a leader in the design, manufacture, and marketing of high-performance
process control metrology systems used in the manufacture of silicon and
compound semiconductor substrates, devices and integrated circuits. Our
metrology systems measure various optical and physical thin film properties,
critical circuit dimensions and layer-to-layer circuit alignment (overlay). The
accurate alignment, or overlay, of successive film layers, relative to each
other, across the wafer is critical for device performance and favorable
production yields. Customers use our process control and metrology systems
during various steps of the manufacturing process, enabling semiconductor and
integrated circuit manufacturers to improve yields, increase productivity and
lower their manufacturing costs.
We were incorporated in California in 1975 and reincorporated in Delaware in
2006. We have been a pioneer and innovator in the field of optical metrology. ...
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